The influence of coping mechanisms on technostress

Weinert C, Maier C, Laumer S, Weitzel T (2013)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2013

Series: Proceedings of the Special Interest Group on Adoption and Diffusion of Information Technology (DIGIT) (Pre-ICIS Workshop)

Conference Proceedings Title: Proceedings of the Special Interest Group on Adoption and Diffusion of Information Technology (DIGIT) (Pre-ICIS Workshop)

Event location: Milan, Italy IT

Abstract

This paper uses a laboratory experiment with perceptual and objective measures from skin conductance response to analyze the influence of different coping strategies on behavioral and psychological strain in the context of techostress. Thereby, behavioral strain is objectively observed in terms of task fulfillment and psychological strain by skin conductance response in four treatment groups, classified by receiving different coping strategies. Initial results of our research reveal that users with no-coping are strained more than those how utilized coping strategies during stressful situations. This also takes place subsequently to the IT-stressor, as the slope of the skin conductance level is negative when applying coping strategies. However, the first results of the SCR indicate that coping strategies have no influence on behavioral strain such as end-user performance. Furthermore, results of a MANOVA outline that the psychological strain level significantly differs between the treatment groups.

Authors with CRIS profile

Sven Laumer Schöller Endowed Chair for Information Systems (Digitalization in Business and Society)

Involved external institutions

Otto-Friedrich-Universität Bamberg DE Germany (DE)

How to cite

APA:

Weinert, C., Maier, C., Laumer, S., & Weitzel, T. (2013). The influence of coping mechanisms on technostress. In International Conference on Information Systems (ICIS) (Eds.), Proceedings of the Special Interest Group on Adoption and Diffusion of Information Technology (DIGIT) (Pre-ICIS Workshop). Milan, Italy, IT.

MLA:

Weinert, Christoph, et al. "The influence of coping mechanisms on technostress." Proceedings of the Proceedings of the Special Interest Group on Adoption and Diffusion of Information Technology (DIGIT) (Pre-ICIS Workshop), Milan, Italy Ed. International Conference on Information Systems (ICIS), 2013.

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