Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT)

Conference contribution
(Conference Contribution)


Publication Details

Author(s): Schriefer T, Hofmann M, März M
Editor(s): Energietechnische Gesellschaft im VDE (ETG) / IEEE Power Engineering Society
Publisher: VDE Verlag
Publication year: 2018
ISBN: 978-3-8007-4540-1
Language: English


Abstract

This work presents a methodology to determine the vibrational resistance of electrical components in power electronic systems. The procedure is exemplified by an IGBT gate driver that is mechano-dynamically characterized applying Laser-Doppler-Vibrometry. The experimental reference is used to validate a finite element model for predicting frequency response functions. Knowing the stress configuration of the gate driver for different automotive design spaces, statistical measures are applied to assess high cycle fatigue. Based on the thesis of linear damage calculation, critical devices are identified and time to failures calculated. As predicted lifetimes significantly exceed reasonable laboratory times, a modified HALT test is introduced that validates the lifetime model.


FAU Authors / FAU Editors

März, Martin Prof. Dr.
Lehrstuhl für Leistungselektronik
Schriefer, Thomas
Lehrstuhl für Elektronische Bauelemente


External institutions with authors

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)


How to cite

APA:
Schriefer, T., Hofmann, M., & März, M. (2018). Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT). In Energietechnische Gesellschaft im VDE (ETG) / IEEE Power Engineering Society (Eds.), Proceedings of the 2018 10th International Conference on Integrated Power Electronics Systems (CIPS). Stuttgart, DE: VDE Verlag.

MLA:
Schriefer, Thomas, Maximilian Hofmann, and Martin März. "Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT)." Proceedings of the 2018 10th International Conference on Integrated Power Electronics Systems (CIPS), Stuttgart Ed. Energietechnische Gesellschaft im VDE (ETG) / IEEE Power Engineering Society, VDE Verlag, 2018.

BibTeX: 

Last updated on 2019-09-07 at 09:26