Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT)

Schriefer T, Hofmann M, März M (2018)

Publication Language: English

Publication Type: Conference contribution, Conference Contribution

Publication year: 2018

Publisher: VDE Verlag

Event location: Stuttgart DE

ISBN: 978-3-8007-4540-1

URI: https://ieeexplore.ieee.org/document/8403138

Abstract

This work presents a methodology to determine the vibrational resistance of electrical components in power electronic systems. The procedure is exemplified by an IGBT gate driver that is mechano-dynamically characterized applying Laser-Doppler-Vibrometry. The experimental reference is used to validate a finite element model for predicting frequency response functions. Knowing the stress configuration of the gate driver for different automotive design spaces, statistical measures are applied to assess high cycle fatigue. Based on the thesis of linear damage calculation, critical devices are identified and time to failures calculated. As predicted lifetimes significantly exceed reasonable laboratory times, a modified HALT test is introduced that validates the lifetime model.

Authors with CRIS profile

Thomas Schriefer Lehrstuhl für Elektronische Bauelemente Martin März Lehrstuhl für Leistungselektronik

Involved external institutions

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB) DE Germany (DE)

How to cite

APA:

Schriefer, T., Hofmann, M., & März, M. (2018). Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT). In Energietechnische Gesellschaft im VDE (ETG) / IEEE Power Engineering Society (Eds.), Proceedings of the 2018 10th International Conference on Integrated Power Electronics Systems (CIPS). Stuttgart, DE: VDE Verlag.

MLA:

Schriefer, Thomas, Maximilian Hofmann, and Martin März. "Vibrational resistance investigation of an IGBT gate driver utilizing Frequency Response Analysis (FRA) and Highly Accelerated Life Test (HALT)." Proceedings of the 2018 10th International Conference on Integrated Power Electronics Systems (CIPS), Stuttgart Ed. Energietechnische Gesellschaft im VDE (ETG) / IEEE Power Engineering Society, VDE Verlag, 2018.

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