Contamination control and ultrasensitive chemical analysis

Ryssel H, Frey L, Streckfuss N, Schork R, Kroninger F, Falter T (1993)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 1993

Journal

Applied Surface Science Elsevier

Book Volume: 63

Pages Range: 79-87

DOI: 10.1016/0169-4332(93)90068-M

Authors with CRIS profile

Heiner Ryssel Technische Fakultät Lothar Frey Lehrstuhl für Elektronische Bauelemente

How to cite

APA:

Ryssel, H., Frey, L., Streckfuss, N., Schork, R., Kroninger, F., & Falter, T. (1993). Contamination control and ultrasensitive chemical analysis. Applied Surface Science, 63, 79-87. https://dx.doi.org/10.1016/0169-4332(93)90068-M

MLA:

Ryssel, Heiner, et al. "Contamination control and ultrasensitive chemical analysis." Applied Surface Science 63 (1993): 79-87.

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