Fauster T (1993)
Publication Status: Published
Publication Type: Journal article
Publication year: 1993
Publisher: American Physical Society
Book Volume: 47
Pages Range: 12980-12983
DOI: 10.1103/PhysRevB.47.12980
For an investigation of the growth and the structure of thin Ag films on Pd(111), the angular distribution of core-level photoelectrons emitted at high kinetic energy (> 500 eV) was measured with a two-dimensional display-type electron spectrometer. At room temperature, Ag grows epitaxially on Pd(111) in the layer-by-layer mode. The Ag films have fcc crystal structure and grow with a stacking fault at the interface relative to the Pd(111) substrate. Low-energy electron-diffraction-intensity measurements show that the first Ag layer is pseudomorphic with the Pd(111) substrate and the stacking fault occurs between the first and the second Ag layers.
APA:
Fauster, T. (1993). GROWTH AND STRUCTURE OF AG ON PD(111) STUDIED BY PHOTOELECTRON FORWARD SCATTERING USING A 2-DIMENSIONAL DISPLAY-TYPE ANALYZER. Physical Review B, 47, 12980-12983. https://dx.doi.org/10.1103/PhysRevB.47.12980
MLA:
Fauster, Thomas. "GROWTH AND STRUCTURE OF AG ON PD(111) STUDIED BY PHOTOELECTRON FORWARD SCATTERING USING A 2-DIMENSIONAL DISPLAY-TYPE ANALYZER." Physical Review B 47 (1993): 12980-12983.
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