Quantification of dislocation structures at high resolution by atomic force microscopy of dislocation etch pits

Sadrabadi P, Durst K, Göken M, Blum W (2009)

Publication Type: Journal article

Publication year: 2009

Journal

Philosophical Magazine Letters Taylor & Francis: STM, Behavioural Science and Public Health Titles / Taylor & Francis

Book Volume: 89

Pages Range: 391-398

Journal Issue: 6

DOI: 10.1080/09500830902984554

Authors with CRIS profile

Karsten Durst Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften) Mathias Göken Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften) Wolfgang Blum Technische Fakultät

Additional Organisation(s)

Lehrstuhl für Werkstoffwissenschaften (Allgemeine Werkstoffeigenschaften)

How to cite

APA:

Sadrabadi, P., Durst, K., Göken, M., & Blum, W. (2009). Quantification of dislocation structures at high resolution by atomic force microscopy of dislocation etch pits. Philosophical Magazine Letters, 89(6), 391-398. https://dx.doi.org/10.1080/09500830902984554

MLA:

Sadrabadi, Peiman, et al. "Quantification of dislocation structures at high resolution by atomic force microscopy of dislocation etch pits." Philosophical Magazine Letters 89.6 (2009): 391-398.

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