Park JY, Maier S, Hendriksen B, Salmeron M (2010)
Publication Language: English
Publication Status: Published
Publication Type: Journal article
Publication year: 2010
Publisher: ELSEVIER SCI LTD
Book Volume: 13
Pages Range: 38-45
Journal Issue: 10
DOI: 10.1016/S1369-7021(10)70185-1
Open Access Link: https://doi.org/10.1016/S1369-7021(10)70185-1
Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well established techniques to image surfaces and to probe material properties at the atomic and molecular scale. In this review, we show hybrid combinations of AFM and STM that bring together the best of two worlds: the simultaneous detection of atomic scale forces and conduction properties. We illustrate with several examples how the detection of forces in STM and the detection of currents in AFM can give valuable additional information of the nanoscale material properties.
APA:
Park, J.Y., Maier, S., Hendriksen, B., & Salmeron, M. (2010). Sensing current and forces with SPM. Materials Today, 13(10), 38-45. https://dx.doi.org/10.1016/S1369-7021(10)70185-1
MLA:
Park, Jeong Y., et al. "Sensing current and forces with SPM." Materials Today 13.10 (2010): 38-45.
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