A Physically Based Reliability Modelling Framework for nm-CMOS RF Devices and Circuits undergoing RF Stress

Cattaneo A (2015)

Publication Type: Thesis

Publication year: 2015

Publisher: Dr. Hut

ISBN: 978-3843923934

Authors with CRIS profile

Andrea Cattaneo Lehrstuhl für Technische Elektronik

How to cite

APA:

Cattaneo, A. (2015). A Physically Based Reliability Modelling Framework for nm-CMOS RF Devices and Circuits undergoing RF Stress (Dissertation).

MLA:

Cattaneo, Andrea. A Physically Based Reliability Modelling Framework for nm-CMOS RF Devices and Circuits undergoing RF Stress. Dissertation, Dr. Hut, 2015.

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