Analyzing the degradation of pre-damaged PV-modules

Beitrag bei einer Tagung
(Konferenzbeitrag)


Details zur Publikation

Autor(en): Buerhop C, Winkler T, Wirsching S, Pickel T, Bemm A, Camus C, Hauch J, Brabec C
Herausgeber: SPIE.DIGITAL LIBRARY
Jahr der Veröffentlichung: 2017
Tagungsband: Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X
Sprache: Englisch


Abstract


Cracked PV-modules are frequently detected in PV-systems. The impact of cracked cells on the energy yield and module performance under real operating conditions is not yet understood but of great relevance. Standard tests cannot reveal the relevant information conclusively. Therefore, we conducted a twofold analysis. 1) field exposure (global analysis on string level as well as detailed analysis on module level), and 2) load testing in the lab. Here, we present comparative electroluminescence (EL-) images recorded in an outdoor test stand and during load testing. Additionally, infrared (IR-) images as well as power data obtained from loaded and operating (field) conditions are discussed.



FAU-Autoren / FAU-Herausgeber

Brabec, Christoph Prof. Dr.
Lehrstuhl für Werkstoffwissenschaften (Materialien der Elektronik und der Energietechnologie)
Wirsching, Sven
Lehrstuhl für Konstruktionstechnik


Autor(en) der externen Einrichtung(en)
Allianz Risk Consulting GmbH, AZT
Bayerisches Zentrum für Angewandte Energieforschung e.V. (ZAE Bayern)


Zitierweisen

APA:
Buerhop, C., Winkler, T., Wirsching, S., Pickel, T., Bemm, A., Camus, C.,... Brabec, C. (2017). Analyzing the degradation of pre-damaged PV-modules. In SPIE.DIGITAL LIBRARY (Eds.), Proc. SPIE 10370, Reliability of Photovoltaic Cells, Modules, Components, and Systems X. San Diego, California, US.

MLA:
Buerhop, Claudia, et al. "Analyzing the degradation of pre-damaged PV-modules." Proceedings of the SPIE Optical Engineering + Applications, San Diego, California Ed. SPIE.DIGITAL LIBRARY, 2017.

BibTeX: 

Zuletzt aktualisiert 2019-27-02 um 17:00