Transverse and longitudinal characterization of electron beams using interaction with optical near-fields

Journal article


Publication Details

Author(s): Kozak M, McNeur J, Leedle K, Deng H, Schönenberger N, Ruehl A, Hartl I, Hoogland H, Holzwarth R, Harris J, Byer RL, Hommelhoff P
Journal: Optics Letters
Publisher: OPTICAL SOC AMER
Publication year: 2016
Volume: 41
Journal issue: 15
Pages range: 3435-3438
ISSN: 0146-9592


Abstract


We demonstrate an experimental technique for both transverse and longitudinal characterization of bunched femtosecond free electron beams. The operation principle is based on monitoring of the current of electrons that obtained an energy gain during the interaction with the synchronized optical near-field wave excited by femtosecond laser pulses. The synchronous accelerating/decelerating fields confined to the surface of a silicon nanostructure are characterized using a highly focused sub-relativistic electron beam. Here the transverse spatial resolution of 450 nm and femtosecond temporal resolution of 480 fs (sub-optical-cycle temporal regime is briefly discussed) achievable by this technique are demonstrated. (C) 2016 Optical Society of America


FAU Authors / FAU Editors

Hommelhoff, Peter Prof. Dr.
Lehrstuhl für Laserphysik
Hoogland, Heinar
Lehrstuhl für Laserphysik
Kozak, Martin
Lehrstuhl für Laserphysik
McNeur, Joshua
Lehrstuhl für Laserphysik
Schönenberger, Norbert
Lehrstuhl für Laserphysik


External institutions with authors

Deutsches Elektronen-Synchrotron DESY
Menlo Systems GmbH
Stanford University


How to cite

APA:
Kozak, M., McNeur, J., Leedle, K., Deng, H., Schönenberger, N., Ruehl, A.,... Hommelhoff, P. (2016). Transverse and longitudinal characterization of electron beams using interaction with optical near-fields. Optics Letters, 41(15), 3435-3438. https://dx.doi.org/10.1364/OL.41.003435

MLA:
Kozak, Martin, et al. "Transverse and longitudinal characterization of electron beams using interaction with optical near-fields." Optics Letters 41.15 (2016): 3435-3438.

BibTeX: 

Last updated on 2019-09-05 at 12:24