Transverse and longitudinal characterization of electron beams using interaction with optical near-fields

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autor(en): Kozak M, McNeur J, Leedle K, Deng H, Schönenberger N, Ruehl A, Hartl I, Hoogland H, Holzwarth R, Harris J, Byer RL, Hommelhoff P
Zeitschrift: Optics Letters
Verlag: OPTICAL SOC AMER
Jahr der Veröffentlichung: 2016
Band: 41
Heftnummer: 15
Seitenbereich: 3435-3438
ISSN: 0146-9592


Abstract


We demonstrate an experimental technique for both transverse and longitudinal characterization of bunched femtosecond free electron beams. The operation principle is based on monitoring of the current of electrons that obtained an energy gain during the interaction with the synchronized optical near-field wave excited by femtosecond laser pulses. The synchronous accelerating/decelerating fields confined to the surface of a silicon nanostructure are characterized using a highly focused sub-relativistic electron beam. Here the transverse spatial resolution of 450 nm and femtosecond temporal resolution of 480 fs (sub-optical-cycle temporal regime is briefly discussed) achievable by this technique are demonstrated. (C) 2016 Optical Society of America



FAU-Autoren / FAU-Herausgeber

Hommelhoff, Peter Prof. Dr.
Lehrstuhl für Laserphysik
Hoogland, Heinar
Lehrstuhl für Laserphysik
Kozak, Martin
Lehrstuhl für Laserphysik
McNeur, Joshua
Lehrstuhl für Laserphysik
Schönenberger, Norbert
Lehrstuhl für Laserphysik


Autor(en) der externen Einrichtung(en)
Deutsches Elektronen-Synchrotron DESY
Menlo Systems GmbH
Stanford University


Zitierweisen

APA:
Kozak, M., McNeur, J., Leedle, K., Deng, H., Schönenberger, N., Ruehl, A.,... Hommelhoff, P. (2016). Transverse and longitudinal characterization of electron beams using interaction with optical near-fields. Optics Letters, 41(15), 3435-3438. https://dx.doi.org/10.1364/OL.41.003435

MLA:
Kozak, Martin, et al. "Transverse and longitudinal characterization of electron beams using interaction with optical near-fields." Optics Letters 41.15 (2016): 3435-3438.

BibTeX: 

Zuletzt aktualisiert 2018-10-08 um 17:54