Carrier-envelope frequency stabilization of a Ti:sapphire oscillator using different pump lasers: part II

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autor(en): Vernaleken A, Schmidt B, Haensch TW, Holzwarth R, Hommelhoff P
Zeitschrift: Applied Physics B-Lasers and Optics
Verlag: Springer Verlag (Germany)
Jahr der Veröffentlichung: 2014
Band: 117
Heftnummer: 1
Seitenbereich: 33
ISSN: 0946-2171


Abstract


Complementing an earlier report (Vernaleken et al. in Opt Exp 20:18387, 2012), we investigate the residual phase jitter of a carrier-envelope frequency stabilized Ti:sapphire oscillator when pumped by additional commercially available pump lasers that were not part of the first study. We find that all tested pump lasers allow stabilization of the oscillator with a residual rms phase noise (integrated between 2 Hz and 5 MHz) of less than 150 mrad despite their different design and properties. Possible sources of technical noise and their elimination for specific models are discussed.



FAU-Autoren / FAU-Herausgeber

Hommelhoff, Peter Prof. Dr.
Lehrstuhl für Laserphysik


Autor(en) der externen Einrichtung(en)
Max-Planck-Institute of Quantum Optics (MPQ) / Max-Planck-Institut für Quantenoptik
Menlo Systems GmbH


Zitierweisen

APA:
Vernaleken, A., Schmidt, B., Haensch, T.W., Holzwarth, R., & Hommelhoff, P. (2014). Carrier-envelope frequency stabilization of a Ti:sapphire oscillator using different pump lasers: part II. Applied Physics B-Lasers and Optics, 117(1), 33. https://dx.doi.org/10.1007/s00340-014-5795-0

MLA:
Vernaleken, Andreas, et al. "Carrier-envelope frequency stabilization of a Ti:sapphire oscillator using different pump lasers: part II." Applied Physics B-Lasers and Optics 117.1 (2014): 33.

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Zuletzt aktualisiert 2018-09-08 um 16:40