Diffusion of Ag into Organic Semiconducting Materials: A Combined Analytical Study Using Transmission Electron Microscopy and X-ray Reflectivity

Fladischer S, Neuhold A, Kraker E, Haber T, Lamprecht B, Salzmann I, Resel R, Grogger W (2012)

Publication Status: Published

Publication Type: Journal article

Publication year: 2012

Journal

ACS Applied Materials and Interfaces American Chemical Society

Publisher: American Chemical Society

Book Volume: 4

Pages Range: 5608-5612

Journal Issue: 10

DOI: 10.1021/am301504j

Abstract

This study shows that the morphology of organic/metal interfaces strongly depends on process parameters and the involved materials. The interface between organic n-type blocking layer materials and the top Ag cathode within an organic photodiode was investigated. Ag was deposited on either amorphous tris-8-hydroxyquinolinato-aluminum (Alq(3)) or crystalline 4,7-diphenyl-1,10-phenanthroline (Bphen) using different deposition techniques such as electron beam deposition, ion beam sputtering, and vacuum thermal evaporation at various deposition rates. The interfaces were studied by transmission electron microscopy and X-ray reflectivity. It was found that Bphen does not show any Ag diffusion no matter which deposition technique was used, whereas the Ag diffusion into Alq(3) depends on the deposition technique and the deposition rate. The highest amount of Ag diffusion into Alq(3) occurred by using thermal vacuum deposition at low deposition rates.

Authors with CRIS profile

Stefanie Rechberger Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)

Additional Organisation(s)

Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)

Involved external institutions

Technische Universität Graz AT Austria (AT) JOANNEUM RESEARCH Forschungsgesellschaft mbH AT Austria (AT) Humboldt-Universität zu Berlin DE Germany (DE)

How to cite

APA:

Fladischer, S., Neuhold, A., Kraker, E., Haber, T., Lamprecht, B., Salzmann, I.,... Grogger, W. (2012). Diffusion of Ag into Organic Semiconducting Materials: A Combined Analytical Study Using Transmission Electron Microscopy and X-ray Reflectivity. ACS Applied Materials and Interfaces, 4(10), 5608-5612. https://dx.doi.org/10.1021/am301504j

MLA:

Fladischer, Stefanie, et al. "Diffusion of Ag into Organic Semiconducting Materials: A Combined Analytical Study Using Transmission Electron Microscopy and X-ray Reflectivity." ACS Applied Materials and Interfaces 4.10 (2012): 5608-5612.

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