Determination of the effective refractive index of nanoparticulate ITO layers

Beitrag in einer Fachzeitschrift

Details zur Publikation

Autor(en): Baum M, Alexeev I, Latzel M, Christiansen S, Schmidt M
Zeitschrift: Optics Express
Verlag: Optical Society of America
Jahr der Veröffentlichung: 2013
Band: 21
Heftnummer: 19
Seitenbereich: 22754--22761
ISSN: 1094-4087
Sprache: Englisch


Nanoparticles of transparent conducting oxides, such as indium tin oxide, can be used in printing techniques to generate functional layers for various optoelectronic devices. Since these deposition methods do not create fully consolidated films, the optical properties of such layers are expected to be notably different from those of the bulk material and should be characterized on their own. In this work we present a way to measure the effective refractive index of a particulate ITO layer by refraction of light. The obtained data points are used to identify an accurate layer model for spectroscopic ellipsometry. In this way the complex refractive index of the particle layer is determined in a wide spectral range from ultra violet to near infrared.

FAU-Autoren / FAU-Herausgeber

Alexeev, Ilya
Lehrstuhl für Photonische Technologien
Baum, Marcus
Lehrstuhl für Photonische Technologien
Schmidt, Michael Prof. Dr.-Ing.
Lehrstuhl für Photonische Technologien

Zusätzliche Organisationseinheit(en)
Erlangen Graduate School in Advanced Optical Technologies
Exzellenz-Cluster Engineering of Advanced Materials

Autor(en) der externen Einrichtung(en)
Max-Planck-Institut für die Physik des Lichts (MPL) / Max Planck Institute for the Science of Light


Baum, M., Alexeev, I., Latzel, M., Christiansen, S., & Schmidt, M. (2013). Determination of the effective refractive index of nanoparticulate ITO layers. Optics Express, 21(19), 22754--22761.

Baum, Marcus, et al. "Determination of the effective refractive index of nanoparticulate ITO layers." Optics Express 21.19 (2013): 22754--22761.


Zuletzt aktualisiert 2018-17-10 um 21:20