Connecting Different Worlds - Technology Abstraction for Reliability-Aware Design and Test

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Details zur Publikation

Autor(en): Schlichtmann U, Kleeberger VB, Abraham JA, Evans A, Gimmler-Dumon C, Glaß M, Herkersdorf A, Nassif SR, Wehn N
Titel Sammelwerk: Proceedings -Design, Automation and Test in Europe, DATE
Verlag: IEEE Press
Verlagsort: New York, NY, USA
Jahr der Veröffentlichung: 2014
Tagungsband: Proc. of Design, Automation and Test in Europe (DATE)
Seitenbereich: 8
ISBN: 978-3-9815370-2-4
ISSN: 1530-1591


Abstract


The rapid shrinking of device geometries in the nanometer regime requires new technology-aware design methodologies. These must be able to evaluate the resilience of the circuit throughout all System on Chip (SoC) abstraction levels. To successfully guide design decisions at the system level, reliability models, which abstract technology information, are required to identify those parts of the system where additional protection in the form of hardware or software coun-termeasures is most effective. Interfaces such as the presented Resilience Articulation Point (RAP) or the Reliability Interchange Information Format (RIIF) are required to enable EDA-assisted analysis and propagation of reliability information. The models are discussed from different perspectives, such as design and test. © 2014 EDAA.



FAU-Autoren / FAU-Herausgeber

Glaß, Michael Prof. Dr.-Ing.
Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)


Autor(en) der externen Einrichtung(en)
IROC Technologies
Technische Universität Kaiserslautern
Technische Universität München (TUM)


Zitierweisen

APA:
Schlichtmann, U., Kleeberger, V.B., Abraham, J.A., Evans, A., Gimmler-Dumon, C., Glaß, M.,... Wehn, N. (2014). Connecting Different Worlds - Technology Abstraction for Reliability-Aware Design and Test. In Proc. of Design, Automation and Test in Europe (DATE) (pp. 8). Dresden: New York, NY, USA: IEEE Press.

MLA:
Schlichtmann, Ulf, et al. "Connecting Different Worlds - Technology Abstraction for Reliability-Aware Design and Test." Proceedings of the Design, Automation and Test in Europe (DATE), Dresden New York, NY, USA: IEEE Press, 2014. 8.

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Zuletzt aktualisiert 2018-09-08 um 23:27