Connecting Different Worlds - Technology Abstraction for Reliability-Aware Design and Test

Schlichtmann U, Kleeberger VB, Abraham JA, Evans A, Gimmler-Dumon C, Glaß M, Herkersdorf A, Nassif SR, Wehn N (2014)

Publication Type: Conference contribution

Publication year: 2014

Publisher: IEEE Press

Edited Volumes: Proceedings -Design, Automation and Test in Europe, DATE

City/Town: New York, NY, USA

Pages Range: 8

Conference Proceedings Title: Proc. of Design, Automation and Test in Europe (DATE)

Event location: Dresden

ISBN: 978-3-9815370-2-4

DOI: 10.7873/DATE2014.265

Abstract

The rapid shrinking of device geometries in the nanometer regime requires new technology-aware design methodologies. These must be able to evaluate the resilience of the circuit throughout all System on Chip (SoC) abstraction levels. To successfully guide design decisions at the system level, reliability models, which abstract technology information, are required to identify those parts of the system where additional protection in the form of hardware or software coun-termeasures is most effective. Interfaces such as the presented Resilience Articulation Point (RAP) or the Reliability Interchange Information Format (RIIF) are required to enable EDA-assisted analysis and propagation of reliability information. The models are discussed from different perspectives, such as design and test. © 2014 EDAA.

Authors with CRIS profile

Michael Glaß Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)

Involved external institutions

IROC Technologies FR France (FR) Technische Universität Kaiserslautern DE Germany (DE) Technische Universität München (TUM) DE Germany (DE)

How to cite

APA:

Schlichtmann, U., Kleeberger, V.B., Abraham, J.A., Evans, A., Gimmler-Dumon, C., Glaß, M.,... Wehn, N. (2014). Connecting Different Worlds - Technology Abstraction for Reliability-Aware Design and Test. In Proc. of Design, Automation and Test in Europe (DATE) (pp. 8). Dresden: New York, NY, USA: IEEE Press.

MLA:

Schlichtmann, Ulf, et al. "Connecting Different Worlds - Technology Abstraction for Reliability-Aware Design and Test." Proceedings of the Design, Automation and Test in Europe (DATE), Dresden New York, NY, USA: IEEE Press, 2014. 8.

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