Electromagnetic Analysis of Fringed Microstrip Lines on Porosified LTCC

Beitrag bei einer Tagung
(Konferenzbeitrag)


Details zur Publikation

Autor(en): Talai A, Steinhäußer F, Gmeiner B, Bittner A, Rüde U, Schmid U, Weigel R, Kölpin A
Titel Sammelwerk: Proceedings of the 2013 International Conference on Electromagnetics in Advanced Applications, ICEAA 2013
Jahr der Veröffentlichung: 2013
Tagungsband: Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Seitenbereich: 1189-1192


Abstract


Recent investigations demonstrated that porosification of LTCC enables a local modification of material properties, in particular of the effective permittivity. These studies revealed that the electric field strength is highest at the lower conductor track edges on the porosified substrate. The local field strength peaks cause substantial influence on the effectiveness of permittivity reduction due near-surface material abrasions. In this paper, the influences of these randomly fringed boundaries on electromagnetic properties are investigated for different degrees of fraying. The gained results are compared to measured screen print edges by scanning electron microscope image analysis of co-fired and post-fired gold conductors, and will contribute for reliable circuit design on porous LTCC in the future. © 2013 IEEE.



FAU-Autoren / FAU-Herausgeber

Gmeiner, Björn Dr.-Ing.
Talai, Armin
Lehrstuhl für Informatik 10 (Systemsimulation)
Kölpin, Alexander PD Dr.
Lehrstuhl für Technische Elektronik
Rüde, Ulrich Prof. Dr.
Lehrstuhl für Informatik 10 (Systemsimulation)
Lehrstuhl für Technische Elektronik
Weigel, Robert Prof. Dr.-Ing.
Lehrstuhl für Technische Elektronik


Autor(en) der externen Einrichtung(en)
Technische Universität Wien


Zitierweisen

APA:
Talai, A., Steinhäußer, F., Gmeiner, B., Bittner, A., Rüde, U., Schmid, U.,... Kölpin, A. (2013). Electromagnetic Analysis of Fringed Microstrip Lines on Porosified LTCC. In Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on (pp. 1189-1192). Torino, IT.

MLA:
Talai, Armin, et al. "Electromagnetic Analysis of Fringed Microstrip Lines on Porosified LTCC." Proceedings of the International Conference on Electromagnetics in Advanced Applications (ICEAA), Torino 2013. 1189-1192.

BibTeX: 

Zuletzt aktualisiert 2018-08-08 um 10:53