Assessing the accuracy of imaging techniques for defect characterization on thin film solar cells
Vetter A, Hofbeck B, Kubis P, Brabec C (2015)
Publication Status: Published
Publication Type: Conference contribution, Conference Contribution
Publication year: 2015
Publisher: Institute of Electrical and Electronics Engineers Inc.
Article Number: 7356385
ISBN: 9781479979448
DOI: 10.1109/PVSC.2015.7356385
Abstract
Imaging methods are an essential tool for improving processing of solar cells. Unfortunately, it is difficult to validate the imaging methods in detail. One focus of our work was to establish an approach by which one can assess the accuracy of the determination of the influence of defects via imaging on CIGS solar cells. The method is, however, not restricted to CIGS and should be easily transferable to other solar cell types, in particular other thin film technologies. The benefit of such a method is the possibility to validate and optimize imaging techniques and, in turn, improving tools to optimize solar cell material and processing of solar cells.
Authors with CRIS profile
Peter Kubis
Institute Materials for Electronics and Energy Technology (i-MEET)
Christoph Brabec
Institute Materials for Electronics and Energy Technology (i-MEET)
Involved external institutions
Germany (DE)How to cite
APA:
Vetter, A., Hofbeck, B., Kubis, P., & Brabec, C. (2015). Assessing the accuracy of imaging techniques for defect characterization on thin film solar cells. In Proceedings of the 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc..
MLA:
Vetter, Andreas, et al. "Assessing the accuracy of imaging techniques for defect characterization on thin film solar cells." Proceedings of the 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 Institute of Electrical and Electronics Engineers Inc., 2015.
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