BILAYER GROWTH IN A METALLIC SYSTEM - FE ON CU(100)

Fauster T (1991)


Publication Status: Published

Publication Type: Journal article

Publication year: 1991

Journal

Publisher: Elsevier

Book Volume: 254

Pages Range: 58-64

DOI: 10.1016/0039-6028(91)90637-8

Abstract

During epitaxial growth of Fe on Cu(100) the normalized Auger signal of Fe was taken as a function of evaporation time. This curve shows evidence for a layer-by-layer growth mode and clearly rules out other possible growth modes. Rutherford backscattering spectrometry was used to determine thicknesses of a one- and two-layer film quantitatively with an accuracy of +/- 0.3 ML. These data together with the Auger analysis unveil a bilayer-by-bilayer growth mode for the first two bilayers.

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How to cite

APA:

Fauster, T. (1991). BILAYER GROWTH IN A METALLIC SYSTEM - FE ON CU(100). Surface Science, 254, 58-64. https://dx.doi.org/10.1016/0039-6028(91)90637-8

MLA:

Fauster, Thomas. "BILAYER GROWTH IN A METALLIC SYSTEM - FE ON CU(100)." Surface Science 254 (1991): 58-64.

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