Reflection Ellipsometry with a Polarimetric Multistatic Array for Short Range Imaging Applications

Cenanovic A, Gumbmann F, Schmidt LP (2011)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2011

Event location: Melbourne AU

ISBN: 978-0-85825-974-4

Abstract

This paper presents an approach for the detection of dielectric layers on human bodies and the determination of their dielectric constant with single frequency measurement data in the W-band (75-110 GHz). The measurements were performed with a polarimetric multistatic array, which was optimized for short range applications. The scattering matrix of each resolution element was analyzed via the reflection ellipsometry method, adopted from optics. For millimeter wave imaging techniques, used in the field of nondestructive testing (NDT) and for security applications, this measurement approach offers an promising alternative to the time domain analysis, which requires broadband data.

Authors with CRIS profile

Amir Cenanovic Lehrstuhl für Hochfrequenztechnik Lorenz-Peter Schmidt Lehrstuhl für Hochfrequenztechnik

How to cite

APA:

Cenanovic, A., Gumbmann, F., & Schmidt, L.-P. (2011). Reflection Ellipsometry with a Polarimetric Multistatic Array for Short Range Imaging Applications. In Proceedings of the Asia-Pacific Microwave Conference. Melbourne, AU.

MLA:

Cenanovic, Amir, Frank Gumbmann, and Lorenz-Peter Schmidt. "Reflection Ellipsometry with a Polarimetric Multistatic Array for Short Range Imaging Applications." Proceedings of the Asia-Pacific Microwave Conference, Melbourne 2011.

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