Effect of eutectics on plastic deformation and subsequent recrystallization in the single crystal nickel base superalloy CMSX-4

Wang L, Pyczak F, Zhang J, Lou LH, Singer R (2012)


Publication Language: English

Publication Status: Published

Publication Type: Journal article

Publication year: 2012

Journal

Publisher: ELSEVIER SCIENCE SA

Book Volume: 532

Pages Range: 487-492

DOI: 10.1016/j.msea.2011.11.015

Abstract

The electron backscattered diffraction (EBSD) technique and transmission electron microscopy (TEM) were used to characterize the microstructure of a locally deformed single crystal (SX) nickel-base superalloy - CMSX-4. The effect of eutectics on the deformation and recrystallization (RX) behavior was investigated. It was found that the texture component map is a reliable method for the determination of the severity of deformation in locally deformed SX superalloys. Severe deformation was mainly created in interdendritic regions, especially around eutectics. The dislocation distribution and configuration was consistent with the nucleation and the growth behavior of recrystallizing grains. (C) 2011 Elsevier B.V. All rights reserved.

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APA:

Wang, L., Pyczak, F., Zhang, J., Lou, L.H., & Singer, R. (2012). Effect of eutectics on plastic deformation and subsequent recrystallization in the single crystal nickel base superalloy CMSX-4. Materials Science and Engineering A-Structural Materials Properties Microstructure and Processing, 532, 487-492. https://dx.doi.org/10.1016/j.msea.2011.11.015

MLA:

Wang, Li, et al. "Effect of eutectics on plastic deformation and subsequent recrystallization in the single crystal nickel base superalloy CMSX-4." Materials Science and Engineering A-Structural Materials Properties Microstructure and Processing 532 (2012): 487-492.

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