Djanatliev A, Dulz W, German R, Schneider V (2011)
Publication Language: English
Publication Type: Conference contribution, Original article
Publication year: 2011
Publisher: IEEE Press
Edited Volumes: Proceedings - Winter Simulation Conference
City/Town: Piscataway, NJ
Pages Range: 3657-3666
Conference Proceedings Title: Proceedings of the 2011 Winter Simulation Conference (WSC '11)
ISBN: 978-1-4577-2108-3
URI: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6148059
An approach is presented in which both simulation and testing based on UML are combined in one framework to achieve an improved overall quality. System models are specified by UML diagrams, and are then mapped on C++-code and executed in the OMNeT++ network simulation framework. State-space oriented test models are defined independently from this to express requirements by selected system usages. From these test models it is possible to generate test cases and to execute them on the simulation code level. By adding Markov chain usage profiles to the test model it is possible to apply statistical test case generation as well. Altogether this allows to validate both kinds of models systematically and iteratively during the development cycle. The methodology is realized by combining appropriate tools and new software components based on the Eclipse RCP. The approach is also well suited for software engineering because standard modeling languages are used. © 2011 IEEE.
APA:
Djanatliev, A., Dulz, W., German, R., & Schneider, V. (2011). VeriTAS - A Versatile Modeling Environment for Test-driven Agile Simulation. In S. Jain, R. R. Creasey, J. Himmelspach, K. P. White, and M. Fu (Eds.), Proceedings of the 2011 Winter Simulation Conference (WSC '11) (pp. 3657-3666). Phoenix (AZ), US: Piscataway, NJ: IEEE Press.
MLA:
Djanatliev, Anatoli, et al. "VeriTAS - A Versatile Modeling Environment for Test-driven Agile Simulation." Proceedings of the Winter Simulation Conference 2011, Phoenix (AZ) Ed. S. Jain, R. R. Creasey, J. Himmelspach, K. P. White, and M. Fu, Piscataway, NJ: IEEE Press, 2011. 3657-3666.
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