Design and Testing of Frequency Selective Surfaces on Thick Silicon Substrate Operating at 600 GHz

Biber S, Bozzi M, Günther O, Perregrini L, Schmidt LP (2005)


Publication Language: English

Publication Type: Conference contribution

Publication year: 2005

Edited Volumes: 35th European Microwave Conference 2005 - Conference Proceedings

Pages Range: 593-596

Conference Proceedings Title: European Microwave Week, Paris, France, September

Event location: Paris

DOI: 10.1109/EUMC.2005.1608926

Abstract

This paper describes the design and experimental verification of frequency selective surfaces, to be used as quasi-optical niters in the sub-millimeter wave range. They consist of a thin metal layer perforated periodically with rectangular or dogbone-shaped holes, and supported by a thick silicon substrate. A set of filters with pass-band at 600 GHz and stop-band at 750 GHz have been designed and tested. The design procedure based on the MoM/BI-RME method, the manufacturing of prototypes by standard processes available from the semiconductor industries, and their measurement by CW and THz time-domain spectroscopy are reported in this work. This class of filters is mechanically robust, presents low losses (1.4 dB), exhibits good reproducibility, and permits a fine tuning of the stop-band frequency by slightly changing the incidence angle.

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How to cite

APA:

Biber, S., Bozzi, M., Günther, O., Perregrini, L., & Schmidt, L.-P. (2005). Design and Testing of Frequency Selective Surfaces on Thick Silicon Substrate Operating at 600 GHz. In European Microwave Week, Paris, France, September (pp. 593-596). Paris.

MLA:

Biber, Stephan, et al. "Design and Testing of Frequency Selective Surfaces on Thick Silicon Substrate Operating at 600 GHz." Proceedings of the 2005 European Microwave Conference, Paris 2005. 593-596.

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