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Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid

Lindlein N (2009)

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Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2009

Publisher: Springer-Verlag Berlin Heidelberg

Pages Range: 701-704

Event location: Stuttgart

ISBN: 9783642030505

DOI: 10.1007/978-3-642-03051-2-117

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How to cite

APA:

Lindlein, N. (2009). Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid. In Proceedings of the 6th International Workshop on Advanced Optical Metrology, Fringe 2009 (pp. 701-704). Stuttgart: Springer-Verlag Berlin Heidelberg.

MLA:

Lindlein, Norbert. "Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid." Proceedings of the 6th International Workshop on Advanced Optical Metrology, Fringe 2009, Stuttgart Springer-Verlag Berlin Heidelberg, 2009. 701-704.

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