Characterization of microoptical components

Lindlein N (2003)


Publication Status: Published

Publication Type: Conference contribution, Conference Contribution

Publication year: 2003

Article Number: 1313527

Event location: Munich

ISBN: 9780780377349

DOI: 10.1109/CLEOE.2003.1313527

Abstract

Microoptical components are more and more important in technical applications due to the miniaturization of optical systems for communication, sensors, visualization devices and other purposes. Since the quality in the fabrication of an optical element cannot be better than the measurement accuracy with which the element can be tested, it is very important that also microoptical components can be characterized with sufficient accuracy. In this paper several measurement devices for microoptical components like rotationally symmetric microlenses and cylindrical microlenses will be presented. © 2003 IEEE.

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How to cite

APA:

Lindlein, N. (2003). Characterization of microoptical components. In Proceedings of the 2003 Conference on Lasers and Electro-Optics Europe, CLEO/EUROPE 2003. Munich.

MLA:

Lindlein, Norbert. "Characterization of microoptical components." Proceedings of the 2003 Conference on Lasers and Electro-Optics Europe, CLEO/EUROPE 2003, Munich 2003.

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