Cone-beam tomography from short-scan cirele-plus-are data measured on a C-arm system
Hoppe S, Dennerlein F, Lauritsch G, Hornegger J, Noo F (2007)
Publication Type: Conference contribution, Conference Contribution
Publication year: 2007
Journal
Original Authors: Hoppe S., Dennerlein F., Lauritsch G., Hornegger J., Noo F.
Book Volume: 5
Pages Range: 2873-2877
Event location: San Diego, CA
Journal Issue: null
DOI: 10.1109/NSSMIC.2006.356476
Abstract
In C-arm computed tomography (CT) systems, the source trajectory does not follow an ideal trajectory. Thus, the real data acquisition geometry is typically expressed by a sequence of projection matrices. However, exact reconstruction algorithms are based on an analytic expression of the projection geometry. In this work, we present a reformulation of an exact reconstruction method to handle projection matrices. In particular, the M-line approach is investigated for a short-scan circle-plus-arc data acquisition. The computation of the derivative with respect to the source trajectory is numerically most critical for which a novel and stable implementation is developed. In order to determine the backprojection range, a 2D polygonal weighting scheme is proposed. Image results are presented from phantom data acquired by a Siemens AXIOM Artis C-arm system. Excellent image results are achieved. Due to the complete data acquisition, the problem of cone artifacts is totally resolved. © 2006 IEEE.
Authors with CRIS profile
Involved external institutions
Germany (DE)
United States (USA) (US)How to cite
APA:
Hoppe, S., Dennerlein, F., Lauritsch, G., Hornegger, J., & Noo, F. (2007). Cone-beam tomography from short-scan cirele-plus-are data measured on a C-arm system. In Proceedings of the 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD (pp. 2873-2877). San Diego, CA.
MLA:
Hoppe, Stefan, et al. "Cone-beam tomography from short-scan cirele-plus-are data measured on a C-arm system." Proceedings of the 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD, San Diego, CA 2007. 2873-2877.
BibTeX: Download