Fluctuations and jump dynamics in atomic friction experiments

Maier S, Sang Y, Filleter T, Grant M, Bennewitz R, Meyer E (2005)

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2005

Journal

Physical Review B American Physical Society

Publisher: AMERICAN PHYSICAL SOC

Book Volume: 72

Journal Issue: 24

DOI: 10.1103/PhysRevB.72.245418

Abstract

Atomic stick-slip processes have been studied in detail by means of friction force microscopy with high spatial and temporal resolution. The influence of the tip-sample contact on the thermal fluctuations of the force sensor and on the dynamics of the stick-slip process are characterized. Results are compared with simulations based on an extended Tomlinson model including thermal fluctuations. A correlation between the duration of the atomic slip event and the atomic structure of the contact is established.

Authors with CRIS profile

Sabine Maier Professur für Experimentalphysik (Rastersondenmikroskopie)

Involved external institutions

McGill University CA Canada (CA) Universität Basel CH Switzerland (CH)

How to cite

APA:

Maier, S., Sang, Y., Filleter, T., Grant, M., Bennewitz, R., & Meyer, E. (2005). Fluctuations and jump dynamics in atomic friction experiments. Physical Review B, 72(24). https://dx.doi.org/10.1103/PhysRevB.72.245418

MLA:

Maier, Sabine, et al. "Fluctuations and jump dynamics in atomic friction experiments." Physical Review B 72.24 (2005).

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