Systematic Quality Assessment of Schottky Diodes for THz-Applications

Biber S, Cojocari O, Mottet B, Rehm G, Schmidt LP (2003)

Publication Type: Conference contribution

Publication year: 2003

Pages Range: 237-242

Conference Proceedings Title: 3rd ESA Workshop on Millimetre Wave Technology and Applications

Event location: Espoo, Finland FI

Authors with CRIS profile

Stephan Biber Lehrstuhl für Hochfrequenztechnik Lorenz-Peter Schmidt Lehrstuhl für Hochfrequenztechnik

How to cite

APA:

Biber, S., Cojocari, O., Mottet, B., Rehm, G., & Schmidt, L.-P. (2003). Systematic Quality Assessment of Schottky Diodes for THz-Applications. In 3rd ESA Workshop on Millimetre Wave Technology and Applications (pp. 237-242). Espoo, Finland, FI.

MLA:

Biber, Stephan, et al. "Systematic Quality Assessment of Schottky Diodes for THz-Applications." Proceedings of the 3rd ESA Workshop on Millimetre Wave Technology and Applications, Espoo, Finland 2003. 237-242.

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