Calibration of the circle-plus-arc trajectory

Hoppe S, Noo F, Dennerlein F, Lauritsch G, Hornegger J (2007)


Publication Type: Conference contribution, Conference Contribution

Publication year: 2007

Journal

Original Authors: Hoppe S., Noo F., Dennerlein F., Lauritsch G., Hornegger J.

Book Volume: 5

Pages Range: 2913-2918

Event location: San Diego, CA

Journal Issue: null

DOI: 10.1109/NSSMIC.2006.356486

Abstract

In this paper, a novel calibration method for C-arm cone-beam (CB) scanners is presented which allows the calibration of the circle-plus-arc trajectory. The circle-plus-arc trajectory has been investigated recently for exact image reconstruction and is especially well suited for C-arm systems. The main idea is the separation of the trajectory into two segments (circle segment and arc segment) which are calibrated independently. For each trajectory segment, a calibration phantom is placed in an optimal way. The calibration results are then combined by computing the transformation the phantom experienced in-between the independent runs. This combination can be done in a postprocessing step by using the Singular Value Decomposition (SVD). The method works for any calibration procedure in which the phantom has a favored orientation with respect to a trajectory segment. Results are presented for both, simulated as well as real data acquired with a Siemens AXIOM Arris C-arm system. © 2006 IEEE.

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How to cite

APA:

Hoppe, S., Noo, F., Dennerlein, F., Lauritsch, G., & Hornegger, J. (2007). Calibration of the circle-plus-arc trajectory. In Proceedings of the 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD (pp. 2913-2918). San Diego, CA.

MLA:

Hoppe, Stefan, et al. "Calibration of the circle-plus-arc trajectory." Proceedings of the 2006 IEEE Nuclear Science Symposium, Medical Imaging Conference and 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, Special Focus Workshops, NSS/MIC/RTSD, San Diego, CA 2007. 2913-2918.

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