Ultrafast screening method for assessing the photostability of thin-film solar cells

Vetter A, Burlafinger K, Brabec C (2016)

Publication Language: English

Publication Status: Published

Publication Type: Journal article, Original article

Publication year: 2016

Journal

Electrical Engineering Springer Verlag (Germany)

Publisher: Springer Verlag

Book Volume: 98

Pages Range: 341-345

Journal Issue: 4

DOI: 10.1007/s00202-016-0418-x

Abstract

Commercial success of optoelectronical devices such as solar cells depend strongly on lifetime next to production costs and power conversion efficiency. While a steep decrease in production costs and significant increase in efficiency have been achieved, lifetime still plays often a limiting factor, in particular, in case of highly innovative new device types. Lifetime tests measuring the stability of devices without external influences (i. p. water) generally take very long time due to the required long lifetime of optoelectronical devices. We established a novel accelerated lifetime test (ALT) setup which may increase the test speed by a factor of several hundred. We verified the setup and the applicability of our ALT measurement routine with an experiment on a well-studied innovative thin-film solar cell type (P3HT:PCBM).

Authors with CRIS profile

Andreas Vetter Institute Materials for Electronics and Energy Technology (i-MEET) Klaus Burlafinger Institute Materials for Electronics and Energy Technology (i-MEET) Christoph Brabec Institute Materials for Electronics and Energy Technology (i-MEET)

How to cite

APA:

Vetter, A., Burlafinger, K., & Brabec, C. (2016). Ultrafast screening method for assessing the photostability of thin-film solar cells. Electrical Engineering, 98(4), 341-345. https://dx.doi.org/10.1007/s00202-016-0418-x

MLA:

Vetter, Andreas, Klaus Burlafinger, and Christoph Brabec. "Ultrafast screening method for assessing the photostability of thin-film solar cells." Electrical Engineering 98.4 (2016): 341-345.

BibTeX: Download