Employing microspectroscopy to track charge trapping in operating pentacene OFETs

Rösner B, Zeilmann N, Schmidt U, Fink R (2014)


Publication Type: Journal article, Original article

Publication year: 2014

Journal

Original Authors: Rösner B., Zeilmann N., Schmidt U., Fink R.H.

Publisher: Elsevier

Book Volume: 15

Pages Range: 435-440

Journal Issue: 2

DOI: 10.1016/j.orgel.2013.12.002

Abstract

Ultrathin pentacene films resemble benchmark and model materials for organic field-effect transistors (OFETs). We employ scanning transmission X-ray microspectroscopy (STXM) and confocal Raman microspectroscopy as highly resolving probes to obtain insight into the correlation of morphology and charge transport in pentacene OFETs. By combining the operation-induced intensity increase in Raman-active bands with micromorphology, we are able to visualize charge-induced effects, in particular charge trapping in pentacene OFETs during operation. The high sensitivity and specificity of Raman microscopy allows to distinguish between orientation and charge-induced effects and thus to locate the trapped charges at grain boundaries.© 2013 Elsevier B.V. All rights reserved.

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APA:

Rösner, B., Zeilmann, N., Schmidt, U., & Fink, R. (2014). Employing microspectroscopy to track charge trapping in operating pentacene OFETs. Organic Electronics, 15(2), 435-440. https://dx.doi.org/10.1016/j.orgel.2013.12.002

MLA:

Rösner, Benedikt, et al. "Employing microspectroscopy to track charge trapping in operating pentacene OFETs." Organic Electronics 15.2 (2014): 435-440.

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