Determination of metrological structural resolution of a CT system using the frequency response on surface structures

Fleßner M, Vujaklija N, Helmecke E, Hausotte T (2015)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2015

Conference Proceedings Title: PTB open access repository

Event location: Wien

DOI: 10.7795/810.20150223B

Open Access Link: http://public.ptb.de/oa/doi/810_20150223b.pdf

Abstract

A novel method for the determination of the structural resolution of a computed tomography (CT) system is presented. The method uses the frequency response of the CT system while measuring the surface of an Aperiodic Spatial Frequency Standard (ASFS). The geometry of the standard allows it to investigate a broader range of possible structural resolutions using just one standard. Simulations and experiments, using CT with different acquisition parameters and a fringe projection system, show that the method is a promising alternative for determining the structural resolution of a measurement system.

Authors with CRIS profile

Matthias Fleßner Lehrstuhl für Fertigungsmesstechnik Eric Helmecke Lehrstuhl für Fertigungsmesstechnik Tino Hausotte Lehrstuhl für Fertigungsmesstechnik

How to cite

APA:

Fleßner, M., Vujaklija, N., Helmecke, E., & Hausotte, T. (2015). Determination of metrological structural resolution of a CT system using the frequency response on surface structures. In PTB open access repository. Wien.

MLA:

Fleßner, Matthias, et al. "Determination of metrological structural resolution of a CT system using the frequency response on surface structures." Proceedings of the MacroScale 2014 - Recent developments in traceable dimensional measurements, Wien 2015.

BibTeX: Download