Determination of metrological structural resolution of a CT system using the frequency response on surface structures

Beitrag bei einer Tagung


Details zur Publikation

Autorinnen und Autoren: Fleßner M, Vujaklija N, Helmecke E, Hausotte T
Jahr der Veröffentlichung: 2015
Tagungsband: PTB open access repository
Sprache: Englisch


Abstract


A novel method for the determination of the structural resolution of a computed tomography (CT) system is presented. The method uses the frequency response of the CT system while measuring the surface of an Aperiodic Spatial Frequency Standard (ASFS). The geometry of the standard allows it to investigate a broader range of possible structural resolutions using just one standard. Simulations and experiments, using CT with different acquisition parameters and a fringe projection system, show that the method is a promising alternative for determining the structural resolution of a measurement system.



FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Fleßner, Matthias
Lehrstuhl für Fertigungsmesstechnik
Hausotte, Tino Prof. Dr.-Ing.
Lehrstuhl für Fertigungsmesstechnik
Helmecke, Eric
Lehrstuhl für Fertigungsmesstechnik


Zitierweisen

APA:
Fleßner, M., Vujaklija, N., Helmecke, E., & Hausotte, T. (2015). Determination of metrological structural resolution of a CT system using the frequency response on surface structures. In PTB open access repository. Wien.

MLA:
Fleßner, Matthias, et al. "Determination of metrological structural resolution of a CT system using the frequency response on surface structures." Proceedings of the MacroScale 2014 - Recent developments in traceable dimensional measurements, Wien 2015.

BibTeX: 

Zuletzt aktualisiert 2018-20-10 um 19:00