Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems
Beitrag bei einer Tagung
Details zur Publikation
Autor(en): Aliee H, Vitzethum S, Glaß M, Teich J, Borgonovo E
Jahr der Veröffentlichung: 2016
Tagungsband: Proceedings of 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and
Seitenbereich: 53-56
FAU-Autoren / FAU-Herausgeber
| | | Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) |
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| Glaß, Michael Prof. Dr.-Ing. |
| | Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) |
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| Teich, Jürgen Prof. Dr.-Ing. |
| | Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design) |
|
Autor(en) der externen Einrichtung(en)
→ Università Commerciale Luigi Bocconi |
Zitierweisen
APA: | Aliee, H., Vitzethum, S., Glaß, M., Teich, J., & Borgonovo, E. (2016). Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems. In Proceedings of 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and (pp. 53-56). Connecticut, US. |
MLA: | Aliee, Hananeh, et al. "Guiding Genetic Algorithms Using Importance Measures for Reliable Design of Embedded Systems." Proceedings of the 29th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Connecticut 2016. 53-56. |