Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience

Hoffmann M, Dietrich C, Lohmann D (2013)

Publication Type: Conference contribution

Publication year: 2013

Pages Range: -

Conference Proceedings Title: Proceedings of the 2nd GI Workshop on Software-Based Methods for Robust Embedded Systems (SOBRES '13)

Event location: Koblenz, Germany DE

URI: http://www4.cs.fau.de/Publications/2013/hoffmann_13_sobres.pdf

Authors with CRIS profile

Martin Hoffmann Lehrstuhl für Informatik 4 (Verteilte Systeme und Betriebssysteme) Christian Dietrich Lehrstuhl für Informatik 4 (Verteilte Systeme und Betriebssysteme) Daniel Lohmann Lehrstuhl für Informatik 4 (Verteilte Systeme und Betriebssysteme)

How to cite

APA:

Hoffmann, M., Dietrich, C., & Lohmann, D. (2013). Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience. In Proceedings of the 2nd GI Workshop on Software-Based Methods for Robust Embedded Systems (SOBRES '13) (pp. -). Koblenz, Germany, DE.

MLA:

Hoffmann, Martin, Christian Dietrich, and Daniel Lohmann. "Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience." Proceedings of the Informatik 2013, Koblenz, Germany 2013. -.

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