Temperature Sensitivity of Large Digital-Beamforming Multistatic mm-Wave Imaging Systems

Schießl A, Ahmed SS, Genghammer A, Schmidt LP (2013)

Publication Language: English

Publication Type: Conference contribution

Publication year: 2013

Journal

IEEE MTT-S International Microwave Symposium Digest Institute of Electrical and Electronics Engineers

Publisher: Institute of Electrical and Electronics Engineers

Edited Volumes: IEEE MTT-S International Microwave Symposium Digest

Conference Proceedings Title: IEEE International Microwave Symposium 2013

Event location: Seattle, USA

DOI: 10.1109/MWSYM.2013.6697783

Abstract

Large multistatic mm-wave imaging systems have recently been developed and proved to be efficient for security applications. This work analyzes the effects caused by temperature changes on the imaging performance of a state-of-the-art system. The temperature dependent phase drift of a single measurement channel is characterized. A linearized model for the phase drifts in the RF channels is thus derived This model is applied to simulate for systematic phase drifts in the recorded raw data of the imaging system at different temperature profiles. Afterwards, images are reconstructed using modified raw data. Accordingly, the degradation in the imaging performance due to temperature changes is presented in terms of image quality and the associated point spread functions. © 2013 IEEE.

Authors with CRIS profile

Andreas Schießl Lehrstuhl für Hochfrequenztechnik Lorenz-Peter Schmidt Lehrstuhl für Hochfrequenztechnik

Involved external institutions

Rohde & Schwarz GmbH & Co. KG DE Germany (DE)

How to cite

APA:

Schießl, A., Ahmed, S.S., Genghammer, A., & Schmidt, L.-P. (2013). Temperature Sensitivity of Large Digital-Beamforming Multistatic mm-Wave Imaging Systems. In IEEE International Microwave Symposium 2013. Seattle, USA: Institute of Electrical and Electronics Engineers.

MLA:

Schießl, Andreas, et al. "Temperature Sensitivity of Large Digital-Beamforming Multistatic mm-Wave Imaging Systems." Proceedings of the 2013 IEEE MTT-S International Microwave Symposium Digest, MTT 2013, Seattle, USA Institute of Electrical and Electronics Engineers, 2013.

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