Considering Diagnosis Functionality during Automatic System-Level Design of Automotive Networks

Eberl M, Glaß M, Teich J, Abelein U (2012)


Publication Type: Conference contribution

Publication year: 2012

Publisher: ACM Press

Edited Volumes: Proceedings - Design Automation Conference

City/Town: New York, NY, USA

Pages Range: 205-213

Conference Proceedings Title: Proc. of The 49th Annual Design Automation Conference 2012 (DAC)

Event location: San Francisco, CA US

ISBN: 978-1-4503-1199-1

DOI: 10.1145/2228360.2228400

Abstract

Today, design automation approaches for automotive E/E-architectures focus solely on application functionality, neglecting firmware-related functionalities like diagnostic tests that are of utmost importance for quality features such as dependability or maintenance. However, the latter are typically considered dispensable since they do not provide direct service to the user. This paper proposes a novel approach for integrating optional diagnosis functionality into a holistic design space exploration of automotive E/E-architectures at system-level. Opposed to application functionality, hardware-diagnostics dig deep into the hardware-structures and, hence, require specific tailoring for the employed resources. A case study with Software-Based Self-Tests representing advanced diagnosis functionality gives evidence of the viability and efficiency of the proposed approach, highlighting the importance of a holistic consideration of application as well as firmware-related functionality. © 2012 ACM.

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How to cite

APA:

Eberl, M., Glaß, M., Teich, J., & Abelein, U. (2012). Considering Diagnosis Functionality during Automatic System-Level Design of Automotive Networks. In Proc. of The 49th Annual Design Automation Conference 2012 (DAC) (pp. 205-213). San Francisco, CA, US: New York, NY, USA: ACM Press.

MLA:

Eberl, Michael, et al. "Considering Diagnosis Functionality during Automatic System-Level Design of Automotive Networks." Proceedings of the The 49th Annual Design Automation Conference 2012 (DAC), San Francisco, CA New York, NY, USA: ACM Press, 2012. 205-213.

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