A Selection Method for Black Box Regression Testing with a Statistically Defined Quality Level

Alagöz I, Herpel T, German R (2017)

Publication Type: Conference contribution

Publication year: 2017

Publisher: Institute of Electrical and Electronics Engineers Inc.

Edited Volumes: Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017

Pages Range: 114-125

Conference Proceedings Title: Software Testing, Verification and Validation (ICST), 2017 IEEE International Conference on

ISBN: 9781509060313

DOI: 10.1109/ICST.2017.18

Authors with CRIS profile

Ibrahim Alagöz Computer Science 7 (Computer Networks and Communication Systems) Reinhard German Computer Science 7 (Computer Networks and Communication Systems)

Related research project(s)

Formal verification and validation of test methods for complex vehicle safety systems in virtual environments Aug. 1, 2014 - Aug. 1, 2017

How to cite

APA:

Alagöz, I., Herpel, T., & German, R. (2017). A Selection Method for Black Box Regression Testing with a Statistically Defined Quality Level. In Software Testing, Verification and Validation (ICST), 2017 IEEE International Conference on (pp. 114-125). Institute of Electrical and Electronics Engineers Inc..

MLA:

Alagöz, Ibrahim, Thomas Herpel, and Reinhard German. "A Selection Method for Black Box Regression Testing with a Statistically Defined Quality Level." Proceedings of the 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 Institute of Electrical and Electronics Engineers Inc., 2017. 114-125.

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