Extraordinary low transmission effects for ultra-thin patterned metal films

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autorinnen und Autoren: Reibold D, Shao F, Erdmann A, Peschel U
Zeitschrift: Optics Express
Verlag: Optical Society of American (OSA)
Jahr der Veröffentlichung: 2009
Band: 17
Heftnummer: 17
Seitenbereich: 544
ISSN: 1094-4087


Abstract

Thin metal films show a residual transmission for light in the visible and UV spectral range. This transmission can be strongly reduced by an appropriate sub-wavelength patterning of the metal film. Our investigation is focused on metal films with a thickness much below 100nm, where the transmission response is dominated by the individual posts acting like antennas and cannot be attributed to the excitation of surface plasmons. The almost complete suppression of transmission for ultra-thin metal films depends mainly on the absorber width, but not on the pitch of the pattern. The effect is robust with respect to imperfections of the geometry or larger features imprinted into the sub-wavelength pattern. © 2008 Optical Society of America.


FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Peschel, Ulf Prof. Dr.
Professur für Experimentalphysik


Zusätzliche Organisationseinheit(en)
Exzellenz-Cluster Engineering of Advanced Materials
Erlangen Graduate School in Advanced Optical Technologies


Einrichtungen weiterer Autorinnen und Autoren

Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie (IISB)


Forschungsbereiche

C Photonic and Optical Materials
Exzellenz-Cluster Engineering of Advanced Materials


Zitierweisen

APA:
Reibold, D., Shao, F., Erdmann, A., & Peschel, U. (2009). Extraordinary low transmission effects for ultra-thin patterned metal films. Optics Express, 17(17), 544. https://dx.doi.org/10.1364/OE.17.000544

MLA:
Reibold, David, et al. "Extraordinary low transmission effects for ultra-thin patterned metal films." Optics Express 17.17 (2009): 544.

BibTeX: 

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