Design Pattern Density Defined

Beitrag bei einer Tagung
(Originalarbeit)


Details zur Publikation

Autor(en): Riehle D
Titel Sammelwerk: Proceedings of the Conference on Object-Oriented Programming Systems, Languages, and Applications, OOPSLA
Verlag: ACM Press
Verlagsort: USA
Jahr der Veröffentlichung: 2009
Tagungsband: Proceedings of the 2009 Conference on Object-Oriented Programming Systems, Languages, and Applications
Seitenbereich: 469-480


Abstract


Design pattern density is a metric that measures how much of an object-oriented design can be understood and represented as instances of design patterns. Expert developers have long believed that a high design pattern density implies a high maturity of the design under inspection. This paper presents a quantifiable and observable definition of this metric. The metric is illustrated and qualitatively validated using four real-world case studies. We present several hypotheses of the metric's meaning and their implications, including the one about design maturity. We propose that the design pattern density of a maturing framework has a fixed point and we show that if software design patterns make learning frameworks easier, a framework's design pattern density is a measure of how much easier it will become. Copyright © 2009 ACM.



FAU-Autoren / FAU-Herausgeber

Riehle, Dirk Prof. Dr.
Professur für Open Source Software


Zitierweisen

APA:
Riehle, D. (2009). Design Pattern Density Defined. In Proceedings of the 2009 Conference on Object-Oriented Programming Systems, Languages, and Applications (pp. 469-480). Orlando, FL, USA: USA: ACM Press.

MLA:
Riehle, Dirk. "Design Pattern Density Defined." Proceedings of the OOPSLA 2009, Orlando, FL, USA USA: ACM Press, 2009. 469-480.

BibTeX: 

Zuletzt aktualisiert 2018-09-08 um 22:38