Elsner C (2009)
Publication Type: Conference contribution
Publication year: 2009
Publisher: Springer-verlag
Edited Volumes: Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
City/Town: Berlin/Heidelberg, Germany
Book Volume: 5795
Pages Range: (to appear)
Conference Proceedings Title: Proceedings of the ACM/IEEE 12th International Conference on Model Driven Engineering Languages and Systems (MODELS 2009), Empirical Results Track
Event location: Denver, Colorado, USA
ISBN: 978-3-642-04424-3
URI: http://www4.informatik.uni-erlangen.de/Publications/2009/elsner_09_models.pdf
DOI: 10.1007/978-3-642-04425-0
This paper summarizes our experience with introducing feature modelling into several product lines within Siemens. Feature models are used for solving various tasks in the product line lifecycle, starting with scoping the reusable asset base up to support for actual product configuration. Using feature models as primary artefacts for managing variability early in the lifecycle, we could improve the efficiency and transparency of scoping activities considerably and made the development efforts way easier to schedule. On the other end of the lifecycle, feature models lowered the engineering efforts in solution business in supporting product configuration and instantiation. © 2009 Springer Berlin Heidelberg.
APA:
Elsner, C. (2009). Variability Modelling Throughout the Product Line Lifecycle. In Proceedings of the ACM/IEEE 12th International Conference on Model Driven Engineering Languages and Systems (MODELS 2009), Empirical Results Track (pp. (to appear)). Denver, Colorado, USA: Berlin/Heidelberg, Germany: Springer-verlag.
MLA:
Elsner, Christoph. "Variability Modelling Throughout the Product Line Lifecycle." Proceedings of the ACM/IEEE 12th International Conference on Model Driven Engineering Languages and Systems (MODELS 2009), Denver, Colorado, USA Berlin/Heidelberg, Germany: Springer-verlag, 2009. (to appear).
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