Simulation-aided Analysis of the Influence of Voids on the Reliability of Solder-joints for LED-Applications

Xu P, Rauer M, Kaloudis M, Franke J (2016)

Publication Type: Conference contribution

Publication year: 2016

Pages Range: 1--6

Conference Proceedings Title: 6th Electronics System-Integration Technology Conference (ESTC)

ISBN: 978-1-5090-1402-6

DOI: 10.1109/ESTC.2016.7764726

Abstract

High power LEDs have become increasingly important for industrial applications due to their long life-cycle and high energy saving potential. To achieve the maximum efficiency and lifetime, the quality and stability of the LED packages must be ensured. A critical factor is the reliability of the solder joints, especially with lead-free solder alloys because of the process-induced voids during the soldering process and consequent failure mechanisms during service. This contribution focuses on the influence of the voids on the reliability of solder joints for high-power LED applications. Concerning the long time scale for the reliability tests such as temperature shock tests (TST) or power cycling tests (PCT), finite-element-method had been considered to enable a simulation-aided analysis and to gain a better understanding of the fatigue behavior of the solder joint with different voids distributions. In the simulation, all the models are based on the real experiments with produced test assemblies with high and low voiding levels. The test assemblies were characterized before and after the reliability tests by using computer tomography (CT) in order to document the crack initiation. Based on the measured dimensions of the solder joints, 3D-models were built with different sizes and positions of voids. For the material behaviors, the Garofalo equation is implemented for calculating the creep strain and to detect the crack initiation. Various test conditions (for TST and PCT) have also been taken account of in order to reduce the deviation between reality and simulation. Finally, the simulated results of crack initiation are compared with the results of real experimental data. The Comparison shows good correlation between simulations and experimental tests with respect to failure modes such as the position of cracks. Potentials and challenges of using numerical methods are also discussed for further studies.

Authors with CRIS profile

Ping Xu Lehrstuhl für Fertigungsautomatisierung und Produktionssystematik Miriam Rauer Lehrstuhl für Fertigungsautomatisierung und Produktionssystematik Jörg Franke Lehrstuhl für Fertigungsautomatisierung und Produktionssystematik

Involved external institutions

Hochschule Aschaffenburg DE Germany (DE)

How to cite

APA:

Xu, P., Rauer, M., Kaloudis, M., & Franke, J. (2016). Simulation-aided Analysis of the Influence of Voids on the Reliability of Solder-joints for LED-Applications. In IEEE (Eds.), 6th Electronics System-Integration Technology Conference (ESTC) (pp. 1--6).

MLA:

Xu, Ping, et al. "Simulation-aided Analysis of the Influence of Voids on the Reliability of Solder-joints for LED-Applications." Proceedings of the 6th Electronics System-Integration Technology Conference (ESTC) Ed. IEEE, 2016. 1--6.

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