An analytical fault model for direct current lines

Conference contribution
(Conference Contribution)


Publication Details

Author(s): Strobl C, Schäfer M, Rabenstein R
Publisher: Institute of Electrical and Electronics Engineers Inc.
Publication year: 2016
Conference Proceedings Title: 2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016
Pages range: 2142-2145
ISBN: 9781479953400


Abstract


DC grids of system voltages above 20V demand different safety concepts compared to conventional AC grids. More elaborate protection devices have to be developed to detect not only high-power, but also low-power faults. The discrimination between faults and load variations can be supported by model-based machine learning methods. For this purpose, this contribution developes time-invariant and linearized system-models with chains of two-ports including possible faults. To consider faults in transmission lines occuring after steady-state system conditions, the initial distribution of voltages and currents is modeled by spatially concentrated equivalent sources. This approach leads to an analytic frequency domain solution without spatial discretization. Measurements on a two-core cable compare favourably with this closed form model.



FAU Authors / FAU Editors

Rabenstein, Rudolf Prof. Dr.
Lehrstuhl für Multimediakommunikation und Signalverarbeitung
Schäfer, Maximilian
Lehrstuhl für Multimediakommunikation und Signalverarbeitung


How to cite

APA:
Strobl, C., Schäfer, M., & Rabenstein, R. (2016). An analytical fault model for direct current lines. In 2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016 (pp. 2142-2145). Montreal, CA: Institute of Electrical and Electronics Engineers Inc..

MLA:
Strobl, Christian, Maximilian Schäfer, and Rudolf Rabenstein. "An analytical fault model for direct current lines." Proceedings of the 2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montreal Institute of Electrical and Electronics Engineers Inc., 2016. 2142-2145.

BibTeX: 

Last updated on 2018-19-04 at 03:34