Alleborn N, Sharma A, Delgado A (2007)
Publication Type: Journal article, Original article
Publication year: 2007
Publisher: Wiley-Blackwell
Book Volume: 85
Pages Range: 586-597
Journal Issue: 5
URI: http://onlinelibrary.wiley.com/doi/10.1002/cjce.5450850504/abstract
This paper investigates the propagation of thickness disturbances on the free surface of a thin viscous liquid film on a solid substrate. On the free surface of the film the disturbances are induced by moving local external pressure perturbations acting on the surface. The analysis is performed by the Fourier-Laplace transform applied to the linearized perturbation equations for small amplitudes. The amplitude of the interface deflection caused by the disturbance, is reconstructed by the inverse Fourier-Laplace transform and numerically evaluated in the long time limit in long wave approximation. The proposed technique appears promising for probing the slip length of a thin film by recording its free surface response to a moving perturbation.
APA:
Alleborn, N., Sharma, A., & Delgado, A. (2007). Probing of thin slipping films by persistent external disturbances. Canadian Journal of Chemical Engineering, 85(5), 586-597. https://doi.org/10.1002/cjce.5450850504
MLA:
Alleborn, Norbert, Ashutosh Sharma, and Antonio Delgado. "Probing of thin slipping films by persistent external disturbances." Canadian Journal of Chemical Engineering 85.5 (2007): 586-597.
BibTeX: Download