Symbolic system level reliability analysis

Beitrag bei einer Tagung

Details zur Publikation

Autorinnen und Autoren: Glaß M, Lukasiewycz M, Reimann F, Haubelt C, Teich J
Jahr der Veröffentlichung: 2010
Tagungsband: Proceedings of the International Conference on Computer-Aided Design (ICCAD)
Seitenbereich: 185-189
ISBN: 9781424481927


More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such complex systems in terms of monetary costs, power consumption, reliability etc. demands for new analysis approaches at the electronic system level. In this paper, two symbolic system level reliability analysis approaches are Introduced. First, a formal approach based on Binary Decision Diagrams is presented that allows to calculate exact reliability measures for small to moderatesized systems. Second, a simulative approach is presented that hybridizes a Monte Carlo simulation with a SAT solver and delivers adequate approximations of the reliability measures for large and complex systems. ©2010 IEEE.

FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Glaß, Michael Prof. Dr.-Ing.
Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)
Haubelt, Christian Prof. Dr.-Ing.
Technische Fakultät
Reimann, Felix
Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)
Teich, Jürgen Prof. Dr.-Ing.
Lehrstuhl für Informatik 12 (Hardware-Software-Co-Design)


Glaß, M., Lukasiewycz, M., Reimann, F., Haubelt, C., & Teich, J. (2010). Symbolic system level reliability analysis. In Proceedings of the International Conference on Computer-Aided Design (ICCAD) (pp. 185-189). San Jose, CA.

Glaß, Michael, et al. "Symbolic system level reliability analysis." Proceedings of the 2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010, San Jose, CA 2010. 185-189.


Zuletzt aktualisiert 2018-26-10 um 14:50