Glaß M, Lukasiewycz M, Reimann F, Haubelt C, Teich J (2010)
Publication Status: Published
Publication Type: Conference contribution, Conference Contribution
Publication year: 2010
Pages Range: 185-189
Article Number: 5654134
Conference Proceedings Title: Proceedings of the International Conference on Computer-Aided Design (ICCAD)
Event location: San Jose, CA
ISBN: 9781424481927
DOI: 10.1109/ICCAD.2010.5654134
More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such complex systems in terms of monetary costs, power consumption, reliability etc. demands for new analysis approaches at the electronic system level. In this paper, two symbolic system level reliability analysis approaches are Introduced. First, a formal approach based on Binary Decision Diagrams is presented that allows to calculate exact reliability measures for small to moderatesized systems. Second, a simulative approach is presented that hybridizes a Monte Carlo simulation with a SAT solver and delivers adequate approximations of the reliability measures for large and complex systems. ©2010 IEEE.
APA:
Glaß, M., Lukasiewycz, M., Reimann, F., Haubelt, C., & Teich, J. (2010). Symbolic system level reliability analysis. In Proceedings of the International Conference on Computer-Aided Design (ICCAD) (pp. 185-189). San Jose, CA.
MLA:
Glaß, Michael, et al. "Symbolic system level reliability analysis." Proceedings of the 2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010, San Jose, CA 2010. 185-189.
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