Fast Simulation of Stuck-At and Coupling Memory Faults Using FAUmachine
Sieh V (2005)
Publication Type: Conference contribution
Publication year: 2005
Pages Range: 1-2
Conference Proceedings Title: In Supplement to Proc. HASE 2005: International Symposium on High Assurance Systems Engineering
Event location: Heidelberg, Germany
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How to cite
APA:
Sieh, V. (2005). Fast Simulation of Stuck-At and Coupling Memory Faults Using FAUmachine. In In Supplement to Proc. HASE 2005: International Symposium on High Assurance Systems Engineering (pp. 1-2). Heidelberg, Germany, DE.
MLA:
Sieh, Volkmar. "Fast Simulation of Stuck-At and Coupling Memory Faults Using FAUmachine." Proceedings of the Ninth IEEE International Symposium on High Assurance Systems Engineering, Heidelberg, Germany 2005. 1-2.
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