High resolution absolute temperature mapping of laser crystals in diode-end-pumped configuration

Didierjean J, Forget S, Chenais S, Balembois F, Georges P, Altmann K, Pflaum C (2005)


Publication Type: Journal article, Report

Publication year: 2005

Journal

Publisher: International Society for Optical Engineering; 1999

Book Volume: 5707

Pages Range: 370--379

DOI: 10.1117/12.593895

Abstract

We report on direct, absolute and spatially resolved temperature measurements in various diode-end-pumped laser crystals, using an infrared camera. Our measurement method requires careful calibrations of the camera, to take into account the emissivity of the crystals. We tested the repeatability of the calibration process, and the linearity of calibrations curves was verified to up to 100°C. We obtained good agreement between experimental results and finite elements analysis simulations done with LASCAD. We also studied and compared different types of thermal contacts and to measure the corresponding heat transfer coefficients using an Yb:YAG crystal. Finally we tried to highlight one of the major controversy concerning the comparison of the thermal behaviours of Nd: YVO4 and Nd:GdVO4 crystals.

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How to cite

APA:

Didierjean, J., Forget, S., Chenais, S., Balembois, F., Georges, P., Altmann, K., & Pflaum, C. (2005). High resolution absolute temperature mapping of laser crystals in diode-end-pumped configuration. Proceedings of SPIE, 5707, 370--379. https://dx.doi.org/10.1117/12.593895

MLA:

Didierjean, Julien, et al. "High resolution absolute temperature mapping of laser crystals in diode-end-pumped configuration." Proceedings of SPIE 5707 (2005): 370--379.

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