Systematic distortions in electro-optical mixers
Gulden P, Becker D, Vossiek M (2003)
Publication Language: English
Publication Type: Conference contribution
Publication year: 2003
Edited Volumes: Proceedings of IEEE Sensors
Book Volume: 2
Pages Range: 1026-1031
Conference Proceedings Title: IEEE Sensors
Event location: Toronto, Canada
DOI: 10.1109/ICSENS.2003.1279098
Abstract
Electro-optical mixers (EOM) have tremendous potential for application in optical intensity-modulated time-of-flight distance measurement systems. Two different devices, Photonic Mixing Devices (PMD) and Metal-Semiconductor-Metal (MSM) are applied to distance measurement in this paper. The experimental results obtained show the presence of systematic distortions in the output signal of the device, resulting in measurement errors of up to a few centimeters. Careful analysis of the effects leads to the conclusion that illumination dependant non-linear effects take place inside local spots of the semiconductor. Consequently the introduction of a small diffusing plate for beam homogenization in front of the semiconductor drastically reduces the amount of systematic distortions. The distance measurement accuracy is doubled for PMDs, and even tripled for MSMs. Additionally the experimental data provides ties between charge injection mechanisms and the observed spurious signals.
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APA:
Gulden, P., Becker, D., & Vossiek, M. (2003). Systematic distortions in electro-optical mixers. In IEEE Sensors (pp. 1026-1031). Toronto, Canada, CA.
MLA:
Gulden, Peter, Dirk Becker, and Martin Vossiek. "Systematic distortions in electro-optical mixers." Proceedings of the Second IEEE International Conference on Sensors: IEEE Sensors 2003, Toronto, Canada 2003. 1026-1031.
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