Peukert W, Mehler C, Thielmann F (2002)
Publication Language: English
Publication Type: Journal article
Publication year: 2002
Publisher: Multi-Science Publishing
Book Volume: 20
Pages Range: 835-848
Article Number: doi: 10.1260/02636170260555769
Journal Issue: 9
URI: http://adt.sagepub.com/content/20/9/835.short
DOI: 10.1260/02636170260555769
The use of dielectric continuum model for the characterization of solid surfaces was combined for the first time with inverse gas chromatography. Extension of dielectric continuum models to adsorption from the gaseous phase allowed the distributed surface properties of solid surfaces to be determined. An inverse gas chromatograph was used for the measurement of adsorption equilibria as a quick alternative to time-consuming measurements by gravimetric or volumetric set-ups. Combination of the two techniques allowed the rapid determination of the distributed properties of solid surfaces to be effected and the results were interpreted in a fundamental physical sense. This led to a novel and promising way for the rapid and exact characterization of solid surfaces.
APA:
Peukert, W., Mehler, C., & Thielmann, F. (2002). Combination of a dielectric continuum model with inverse gas chromatography for the characterization of solid surfaces. Adsorption Science & Technology, 20(9), 835-848. https://doi.org/10.1260/02636170260555769
MLA:
Peukert, Wolfgang, Carsten Mehler, and Frank Thielmann. "Combination of a dielectric continuum model with inverse gas chromatography for the characterization of solid surfaces." Adsorption Science & Technology 20.9 (2002): 835-848.
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