Quantitative EDXS analysis of organic materials using the zeta-factor method

Beitrag in einer Fachzeitschrift


Details zur Publikation

Autorinnen und Autoren: Fladischer S, Grogger W
Zeitschrift: Ultramicroscopy
Verlag: Elsevier
Jahr der Veröffentlichung: 2014
Band: 136
Seitenbereich: 26-30
ISSN: 0304-3991


Abstract


In this study we successfully applied the zeta-factor method to perform quantitative X-ray analysis of organic thin films consisting of light elements. With its ability to intrinsically correct for X-ray absorption, this method significantly improved the quality of the quantification as well as the accuracy of the results compared to conventional techniques in particular regarding the quantification of light elements. We describe in detail the process of determining sensitivity factors (zeta-factors) using a single standard specimen and the involved parameter optimization for the estimation of C-factors for elements not contained in the standard. The C-factor method was then applied to perform quantitative analysis of organic semiconducting materials frequently used in organic electronics. Finally, the results were verified and discussed concerning validity and accuracy. (C) 2013 Elsevier B.V. All rights reserved.



FAU-Autorinnen und Autoren / FAU-Herausgeberinnen und Herausgeber

Rechberger, Stefanie Dr.
Lehrstuhl für Werkstoffwissenschaften (Mikro- und Nanostrukturforschung)


Zusätzliche Organisationseinheit(en)
Interdisziplinäres Zentrum, Center for Nanoanalysis and Electron Microscopy (CENEM)


Zitierweisen

APA:
Fladischer, S., & Grogger, W. (2014). Quantitative EDXS analysis of organic materials using the zeta-factor method. Ultramicroscopy, 136, 26-30. https://dx.doi.org/10.1016/j.ultramic.2013.07.015

MLA:
Fladischer, Stefanie, and Werner Grogger. "Quantitative EDXS analysis of organic materials using the zeta-factor method." Ultramicroscopy 136 (2014): 26-30.

BibTeX: 

Zuletzt aktualisiert 2019-29-05 um 15:55